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More Info:
Equipment description and usage:
Wyko-NT1100 is a non-contact optical profiling system that provides high resolution, 3D surface measurement, from sub-nanometer surface roughness to millimeter step-height. Two measurement modes are available. Phase-Shifting Interferometry (PSI) mode allows high-resolution measurement of smooth surface and small steps, while Vertical Scanning Interferometry (VSI) mode allows measuring rough surfaces and steps up to several millimeters high.
Surface analysis for thin films and bulk materials
Features:
* Two measurement modes, PSI and VSI
* The full WycoVision�32 analytical software package.
* Advanced optics ensure sub-nanometer vertical resolution at all magnifications.
* The Data Stitching option adds a motorized stage for high resolution measurements over a larger field of view.
Comments:
Contact Info:
Jason Tresback
LISE G46
11 Oxford Street
Cambridge, MA 02138
617-496-1783
jtresbackcns.fas.harvard.edu
Jiangdong Deng
LISE G54
11 Oxford Street
Cambridge, MA 02138
617-495-3396
jdengcns.fas.harvard.edu
cns.fas.harvard.edu
