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More Info:
The JEOL Cross section polisher uses Ar Ion milling to polish cross sections for SEM observation.
Comments:
* Great For samples too sensitive for mechanical polishing, soft, hard, and composite samples
* Excellent mirror finish
* Minimum distortion of samples; ideal for preliminary processing of samples for crystal orientation analysis (EBSD)
* Large cross sections 1 mm wide
Suitable for failure analysis of plated items and electronic devices
* Easy to use operation panel
Contact Info:
Dave Lange
LISE B50
11 Oxford Street
Cambridge, MA 02138
617-495-2375
langecns.fas.harvard.edu
Adam Graham
LISE B50
11 Oxford Street
Cambridge, MA 02138
617-384-8912
agrahamcns.fas.harvard.edu
cns.fas.harvard.edu
