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More Info:
Ultra-low-energy, concentrated ion beam is ideal for preparing today's specimens of advanced materials for TEM imaging and analysis. Unique ion beam technology produces specimens free from amorphous and implanted layers. The NanoMill is capable of post-FIB (focused ion beam) processing and
conventional specimen preparation. It is flexible, easily programmable.
Comments:
High precision Ar Ion mill for TEM sample prepartaion.
Contact Info:
Adam Graham
LISE B50
11 Oxford Street
Cambridge, MA 02138
617-384-8912
agrahamcns.fas.harvard.edu
David Bell
LISE B56
11 Oxford Street
Cambridge, MA 02138
617-496-6794
dcbcns.fas.harvard.edu