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More Info:
X-rays excite the atoms of the sample to emit radiation. This radiation is measured by a semiconductor detector. To achieve a higher sensitivity, the exciting radiation can be optimized by using targets*. The unit is delivered including a prepared analysis method. Data are already stored in the unit's memory. The measured values are compared with these data. After the measurement is complete, the results relating to an unknown sample are displayed on the screen. The sample material can be solid, liquid or a powder.
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Contact Info:
Hao-Yu (Greg) Lin
LISE G40
11 Oxford Street
Cambridge, MA 02138
617-384-5028
hlincns.fas.harvard.edu
Fettah Kosar
LISE G48
11 Oxford St.
Cambridge, MA 02138
617-495-1738
fkosarcns.fas.harvard.edu
cns.fas.harvard.edu
