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More Info:
Detectors available: In-lens SE, Everhart-Thornley SE, EsB (Energy selective Backscattered electron detector), AsB (Angle selective Backscattered electron detector), and STEM (Scanning Transmission Electron detector). EDS detector
Comments:
The Ultra55 Field Emission Scanning Electron Microscope (FESEM) allows surface examination down to nanometer scales. The SEM uses a low to moderate energy (0.1 to 30 keV) electron beam to image a sample in high vacuum with resolutions down to 1 nanometer at 15 keV and 1.7 nm at 1 keV.
Contact Info:
Dave Lange
LISE B50
11 Oxford Street
Cambridge, MA 02138
617-495-2375
langecns.fas.harvard.edu
David Bell
LISE B56
11 Oxford Street
Cambridge, MA 02138
617-496-6794
dcbcns.fas.harvard.edu