Imaging and Analysis |
| JEOL 2010 FEG - TEM/STEM |
| CNS ID: HAR-001 |
| Make: JEOL |
| Model: 2010 |
| Category: Transmission Electron Microscopy (TEM) |
| Name: JEOL 2010 FEG - TEM/STEM |
| Location: LISE - B15G |
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No Image Available |
More Info:
Equipment description and usage:
The JEOL TEM/STEM is a transmission electron microscope for imaging solid materials that can perform high resolution lattice imaging in TEM mode or annular-dark field (DF) lattice imaging in STEM (scanning) mode. Bright Field (BF) and Dark Field (DF) imaging are performed in both TEM and STEM modes, phase contrast imaging, Energy Dispersive X-ray Spectroscopy (EDS) in both point & chemistry mapping modes. Atomic arrangements are determined by electron diffraction in Selected Area, CBED (convergent beam), and nanodiffraction modes.
Imaging/Analysis:
* Lattice resolution is 0.19nm pt-to-pt in TEM mode and STEM probe resolution is 0.2nm. Beam energy to 200kV.
* Vacuum requirements: sample at <1x10-5 Pascal.
* X-tilt +/-30°, Y-tilt +/-12° (depending on holder)
* X/Y motion +/-1mm, Z motion +/-0.2mm
* 3 CCD cameras capturing magnifications 50x to 50Mx.
* EDS x-ray detector, Be and higher Z, 0.1% sensitivity, mapping.
In situ Experiments:
* Vacuum requirements: sample at <1x10-5 Pascal.
* Heating (double tilt) holder: to 1000C<500C without water cooling
* Cryo holder: -180C to 200C, cryo-transfer
* AFM tip holder
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Comments:
w/EDS |
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| Contact Info: |
David Bell
LISE B56
11 Oxford Street
Cambridge, MA 02138
617-496-6794
dcb cns.fas.harvard.edu |
Adam Graham
LISE B50
11 Oxford Street
Cambridge, MA 02138
617-384-8912
agrahamcns.fas.harvard.edu |
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